Impact of dopant species on the interfacial trap density and mobility in amorphous In-X-Zn-O solution-processed thin-film transistors

Alloying of In/Zn oxides with various X atoms stabilizes the IXZO structures but generates electron traps in the compounds, degrading the electron mobility. To assess whether the latter is linked to the oxygen affinity or the ionic radius, of the X element, several IXZO samples are synthesized by the sol-gel process, with a large number (14) of X elements. The IXZOs are characterized by XPS, SIMS, DRX, and UV-spectroscopy and used for fabricating thin film transistors. Channel mobility and the interface defect density NST, extracted from the TFT electrical characteristics and low frequency noise, followed an increasing trend and the values of mobility and NST are linked by an exponential relation. The highest mobility (8.5 cm2/Vs) is obtained in In-Ga-Zn-O, and slightly lower value for Sb and Sn-doped IXZOs, with NST is about 2E12 cm2/eV, close to that of the In-Zn-O reference TFT. This is explained by a higher electronegativity of Ga, Sb, and Sn than Zn and In, their ionic radius values being close to that of In and Zn. Consequently, Ga, Sb, and Sn induce weaker perturbations of In-O and Zn-O sequences in the sol-gel process, than the X elements having lower electronegativity and different ionic radius. The TFTs with X = Ca, Al, Ni and Cu exhibited the lowest mobility and NST > 1E13 cm2/eV, most likely because of metallic or oxide clusters formation

Non-Arrhenius conduction due to the interface-trap-induced disorder in X-doped amorphous InXZnO thin-film transistors

Thin film transistors, with channels composed of In-X-Zn oxides, IXZO, with X dopants: Ga, Sb, Be, Mg, Ag, Ca, Al, Ni, and Cu, were fabricated and their I-V characteristics were taken at selected temperatures in the 77K<T<300K range. The low field mobility, mu, and the interface defect density, Nst were extracted from the characteristics for each of the studied IXZOs. At higher T the mobility follows the Arrhenius law with an upward distortion, increasing as T was lowered, gradually transforming into the exp [-(T0/T)1/4] variation. We showed that mu(T, Nst) follows mu0exp[-Eaeff(T,Nst)/kT], with T-dependent effective activation energy Eaeff(T, Nst) accounts for the data, revealing a linear correlation between Eaeff and Nst at higher T. Temperature variation of Eaeff(T, Nst) was evaluated using a model assuming a random distribution of conduction mobility edge Ec values in the oxides, stemming from spatial fluctuations induced by disorder in the interface traps distribution. For a Gaussian distribution of Ec, the activation energy Eaeff(T, Nst) varies linearly with 1/T, which accounts satisfactorily for the data obtained on all the studied IXZOs. The model also shows that Eaeff(T, Nst) is a linear function of Nst at a fixed T, which explains the exponential decrease of mu with NST

Physics of the frequency response of rectifying organic Schottky diodes

International audienceThe frequency response of unipolar organic Schottky diodes used in a rectifying circuit, such as an RFID tag, has been investigated in detail. The time dependent response of rectifying circuits has been simulated solving both the Drift Diffusion and Poisson equations to model the hole transport within the diode, coupled with time dependent circuit equations. Several approximations have also been discussed. It turns out that the cut off frequency of the rectifying circuit is indeed limited by the carrier time-of-flight and not by the diode equivalent capacitance. Simulations have also been confirmed by comparison with experiments, involving diodes with different mobilities and thicknesses. This work confirms that the 13.56MHz frequency can be reached using polymer semiconductors, as already experimentally demonstrated in the literature, by an adequate control of the active layer thicknes

Inkjet printing of organic electrochemical immunosensors

International audienc

Electrical transport in thin film transistors with In-Zn-O channels doped with post-transition metals

International audienc

Développement de capteurs immunologiques électrochimiques flexibles par impression complète

International audienc

Electrical transport in thin film transistors with In-Zn-O channels doped with post-transition metals

International audienc

Electrical transport in thin film transistors with In-Zn-O channels doped with post-transition metals

International audienc

Chemically improved high performance solution processed indium gallium zinc oxide thin-film transistors

session Electronic Materials (I6.6)International audienc

Fast behavioral modeling of organic CMOS devices for digital and analog circuit applications

International audienc